Tandon leads the future of manufacturing

In early May NYU Tandon played host to the second annual IEEE Workshop On Reliable & Resilient Digital Manufacturing, a two-day event that drew academic, government, and industry leaders from across the country to discuss a wide range of topics relevant to the manufacturing sector, including security, artificial intelligence, technological advances, and future implementations. 

Organized by Professors Nikhil Gupta and Ramesh Karri of the NYU Center for Cybersecurity, in partnership with Professor Nektarios Tsoutsos of the University of Delaware’s Center for Cybersecurity, Assurance and Privacy, the workshop featured keynote talks by esteemed experts like Dr. Andrew Wells, the Program Director in Advanced Manufacturing at the National Science Foundation; Dr. Yan Lu, the Information Modeling and Testing Group Leader at the National Institute of Standards and Testing; Dr. Ronald Paveda, a researcher at Naval Air Systems Command (and a former doctoral student at NYU Tandon); and Professor A. Narasimha Reddy of Texas A&M. 

Among the practical topics covered over the course of two days were how to balance 3D printing opportunities and security in the case of aftermarket parts, designing traceability and anti-counterfeiting schemes for mechanical parts, and the ways in which additive manufacturing can be leveraged by the solar-energy industry. The speakers presented novel strategies to design, manufacture and test parts made by modern digital manufacturing tools. (See a complete list of presentations in the workshop program.)

“Multiple industries of the future, including semiconductors, quantum information technology, and biotechnology, will rely on advanced digital manufacturing techniques,” explained Wells. “NSF supports fundamental research and education to develop and implement these new manufacturing technologies with resilient systems and supply chains to advance emerging industries and build a robust industrial base.”

“With additive manufacturing now being used in a rapidly growing number of areas – from medical, energy, and automotive, to heavy equipment and defense, it’s imperative to ensure the security and reliability of our systems and processes,” said Gupta. “It was gratifying to be able to bring together so many experts addressing these vital concerns, and I am grateful to the National Science Foundation and IEEE for their support.”