Integrated Imaging: Creating Images form the Tight Integration of Algorithms, Computation, and Sensors

Friday, May 6, 2016 - 11:00am EDT

  • Location:2 Metrotech Center, 10th Floor, 10.099
  • Contact:Yi Fang
    yfang@nyu.edu

Speaker: Charles A. Boumamn, Purdue University

Imaging research is entering into a new era of innovation driven by the tight integration of algorithms, computation, and sensor design. This emerging field, which we call integrated imaging, is evolving from classical sensors and developing into a wide array of new imaging modalities and applications. Integrated imaging systems will drive both scientific exploration and consumer products by blending novel and often counter-intuitive sensor design with algorithms that exploit the availability of enormous quantities of data and computation. This talk presents some examples of state-of-the-art integrated imaging systems based on computed tomography (CT), transmission electron microscopy (TEM), synchrotron beam imaging, optical sensing, and scanning electron microscopy (SEM). For each of these examples, we also explore their use and potential impact in applications ranging from healthcare to jet engine design. We conclude with some speculation on where integrated imaging might be going; where it might have greatest impact; and what will be the greatest challenges ahead.

Bio: Charles A. Bouman is the Showalter Professor of Electrical and Computer Engineering and Biomedical Engineering at Purdue University. He received his B.S.E.E. degree from the University of Pennsylvania, M.S. degree from the University of California at Berkeley, and Ph.D. from Princeton University in 1989.

Professor Bouman’s research is in statistical signal and image processing in applications ranging from medical to scientific and consumer imaging. His research resulted in the first commercial model-based iterative reconstruction (MBIR) system for medical X-ray computed tomography (CT), and he is co-inventor on over 47 issued patents that have been licensed and used in millions of consumer imaging products. Prof. Bouman is member of the National Academy of Inventors, a Fellow of the IEEE, AIMBE, IS&T, and SPIE. He has served as the IEEE Signal Processing Society’s Vice President of Technical Directions, Editor-in-Chief of the IEEE Transactions on Image Processing, Vice President of Publications for the IS&T Society and was the 2014 recipient of the Electronic Imaging Scientist of the Year award.