Friday, April 15, 2011 - 9:00am - 6:00pm EDT
- Location:New York University
19 Washington Square North
New York, NY
- Contact:To attend, RSVP to Kerry Barrett
Organized by Ozgur Sinanoglu, Assistant Professor of Engineering, NYU Abu Dhabi
The global supply chain in electronics design and fabrication has brought affordability, accessibility and flexibility to the semiconductor market worldwide, but has also introduced the threat of hardware Trojans inserted in the circuitry. In addition to the traditional reliability issues such as defects that are end-results of imperfections in chip manufacturing, and transient errors that occur due to cosmic radiation, the intentional malicious changes implanted in electronic chips during design and/or manufacturing pose immense risks to the users. This workshop brings together experts from academia and industry to discuss hardware reliability and security challenges, aiming to provide judicious design techniques to cope with them.
9:00 - 9:30am Registration
9:30 - 10:30am Opening Remarks
- 9:30 - 9:45am Paul Horn, Senior Vice Provost for Research, NYU
- 9:45 - 10:00am Sunil Kumar, Dean of Engineering, NYUAD
- 10:00 - 10:15am Walid Ali, Senior Manager, R&D, Abu Dhabi Ecosystem Development, ATIC
"A New Horizon for Semiconductor Industry: Collaborative Efforts between NYUAD and ATIC"
- 10:15 – 10:30am Ralph Cavin, Vice President, Research Operations, The Semiconductor Research Corporation
"The SRC/ATIC University Research Initiative in Abu Dhabi"
10:30am - 12:30pm Session I: Hardware Security and Trust Chair: Brion Keller
- 10:30 - 11:00am Ramesh Karri, Professor of Electrical and Computer Engineering, NYU-Poly
“VLSI Testing and Hardware Security: Two Sides of the Same Coin”
- 11:00 - 11:30am Peilin Song, Research Staff Member at the IBM Thomas J. Watson Research Center
"MARVEL - Malicious Alteration Recognition and Verification by Emission of Light"
- 11:30am - 12:00pm Mohammad Tehranipoor, Associate Professor of Electrical and Computer Engineering, the University of Connecticut
"Design for Security and Trust for Integrated Circuits"
- 12:00 - 12:30pm Yiorgos Makris, Associate Professor of Electrical Engineering and Computer Science, Yale University
"Post-Deployment Trust Monitoring in Wireless Cryptographic ICs"
12:30 - 1:30pm Lunch
1:30 - 3:00pm Session II: Design-for-Testability & Testing for Manufacturing Defects Chair: Yiorgos Makris
- 1:30 – 2:00pm Vishwani Agrawal, James J. Danaher Professor of Electrical and Computer Engineering, Auburn University
"Testing for Faults, Looking for Defects"
- 2:00 - 2:30pm Alex Orailoglu, Professor of Computer Science and Engineering, University of California, San Diego
"Diagnosing Scan Chain Timing Faults through Statistical Feature Analysis of Scan Images"
- 2:30 – 3:00pm Brion Keller, Sr. Architect, Cadence Design Systems
"The Increasing Complexity of Test for Integrated Circuits"
3:00 - 3:30pm Coffee
3:30 - 5:00pm Session III: Reliability Issues in Emerging Technologies Chair: Ozgur Sinanoglu
- 3:30 - 4:00pm Nur Touba, Professor of Electrical and Computer Engineering, the University of Texas at Austin
"Soft Error Mitigation"
- 4:00 - 4:30pm Subhasish Mitra, Assistant Professor Departments of Electrical Engineering and Computer Science Stanford University; Director of the Robust Systems Group in the Departments of Electrical Engineering and Computer Science
"Imperfection-Immune Digital VLSI using Carbon Nanotube Field Effect Transistors"
- 4:30 – 5:00pm Shawn Blanton, Professor of Electrical and Computer Engineering, Carnegie Mellon University
"Improving Design for Manufacturability (DFM) through Test-Data Mining"
5:00 - 6:00pm Roundtable Discussion Session: “Efficient Development of Semiconductor Ecosystem in Abu Dhabi”
Panelists: Walid Ali and Ralph Cavin
Topics to discuss:
- What are the main ingredients of such an ecosystem?
- What are the lessons learnt from past experience that Abu Dhabi can benefit from?
- SWOT analysis: Strengths, weaknesses, opportunities and threats?
- How can NYU contribute?
- What can ATIC do?
- How can you contribute?